A new high resolution XRD was acquired in 2006. The Rigaku Ultima III enables a variety of applications including in-plane and normal geometry phase identification, quantitative analysis, lattice parameter refinement, crystallite size, structure refinement, density, roughness and multilayer thicknesses (from reflectivity geometries), and depth-controlled phase identification.
Detection consists of a computer-controlled scintillation counter or a fast semiconductor-based position sensitive detector.
In addition to standard Bragg geometries, the system is capable of thin film analysis, grazing incidence diffraction, pole figure analysis, transmissive and reflective small-angle x-ray scattering, and reciprocal space mapping. It also has a 1500°C hot stage.
Instrument Specifications
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X-Ray Generator
- Maximum rated output 3 kW
- Rated tube voltage 20 - 60 kV
- Rated tube current 2 - 60 mA
- Target: Cu
- Focus size 0.4 x 12 mm
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Monochromators
- Dual position graphite diffracted beam monochromator
Ge (220) 2-bounce high-resolution incident beam monochromator [CURRENTLY UNAVAILABLE]
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Detectors
- Scintillation counter
D/tex-25 fast position sensitive detector (up to 160° 2θ / minute) [CURRENTLY UNAVAILABLE]
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Goniometer
- Scanning mode - θs/θd coupled or θs, θd independent
- Goniometer radius 285 mm
- 2θ measuring range -3 to 162° (maximum)
- Minimum step size 0.0001°
- In-plane arm
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Attachments
- Thin film attachment
- Transmission small angle x-ray scattering
HT 1500 high temperature attachment (up to 1500°C), may be operated in air, gas, or vacuum [CURRENTLY UNAVAILABLE]
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Optics
- Automatic alignment of tube height, goniometer, optics and detector
- Divergence slit - Fixed or automatic variable
- Scattering slit - Fixed or automatic variable
- Receiving slit - Fixed or automatic variable
- Soller slits – incident beam 5° and 0.5°; diffracted beam 5°, 0.5°, and 0.11°
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Software
- Jade v9 w/ search/match
- ICDD PDF-4+ 2019
- Nano-Solver v3.4
- XRR 2006 v2.0
- Rocking curve simulation v3.03
- Positive pole figure
- Inverse pole figure
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A new high resolution XRD was acquired in 2006. The Rigaku Ultima III enables a variety of applications including in-plane and normal geometry phase identification, quantitative analysis, lattice parameter refinement, crystallite size, structure refinement, density, roughness and multilayer thicknesses (from reflectivity geometries), and depth-controlled phase identification.